Yuan Ze University - Department of Mechanical Engineering
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研究儀器設備
霍爾效應測試儀
霍爾效應測試儀
Placement:R3006
Controller:沈炳臣
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可用於確認半導體薄膜電特性,如載子濃度、移動率、電阻率及霍爾係數等。本系統配備電流電壓量測功能以確認試片歐姆接點特性。主要利用 Van Der Pauw 四點探針法和霍爾效應,量測薄膜中多數載子濃度與遷移率,此系統可於77K與室溫下量測各種N型與P型半導體及化合物半導體薄膜電特性。
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